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Two-pulse laser source of excitation of atomic emission spectra
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Two-pulse laser source of excitation of atomic emission spectra
The laser source is designed to excite atomic emission spectra when performing qualitative spectral analysis of hard rocks - metals, minerals, glasses and others.
The source is based on a two-pulse YAG: Nd laser with electro-optic Q-switching operating at the main wavelength of 1064 nm. The duration of each pulse is no more than 10 ns, and the delay between them is adjustable from 0 to 60 microseconds.
The possibility of the laser beam to focus on an area of 300 to 1000 microns makes it possible to conduct microanalysis of inclusions, perform two-dimensional scanning of the surface or locally analyze samples with virtually no damage to the surface. A significant advantage of the laser source is the expressiveness and lack of special sample preparation for a wide range of conductive and non-conductive materials.
Visual observation and pointing of the beam at the sample is carried out using a stereoscopic microscope integrated into the system, as well as a high-resolution digital video camera with image transmission to a computer.
Moving the instrument table with a fixed sample is possible both manually for adjustment, and with the help of stepper motors in two coordinates during analysis, which provides surface scanning and spectrum recording with reference to the video image. The installation can be used in conjunction with any spectral devices – "Grand", "Aspect", "Express", "Hummingbird-2", STE-1, DFS-458, MFS-8, PGS-2 and others. The laser source is designed to excite atomic emission spectra when performing high-quality spectral analysis of hard rocks – metals, minerals, glasses and others.
The source is based on a two-pulse YAG: Nd laser with electro-optic Q-switching operating at the main wavelength of 1064 nm. The duration of each pulse is no more than 10 ns, and the delay between them is adjustable from 0 to 60 microseconds.
The possibility of the laser beam to focus on an area of 300 to 1000 microns makes it possible to conduct microanalysis of inclusions, perform two-dimensional scanning of the surface or locally analyze samples with virtually no damage to the surface. A significant advantage of the laser source is the expressiveness and lack of special sample preparation for a wide range of conductive and non-conductive materials.
Visual observation and pointing of the beam at the sample is carried out using a stereoscopic microscope integrated into the system, as well as a high-resolution digital video camera with image transmission to a computer.
Moving the instrument table with a fixed sample is possible both manually for adjustment, and with the help of stepper motors in two coordinates during analysis, which provides surface scanning and spectrum recording with reference to the video image. The installation can be used in conjunction with any spectral devices – "Grand", "Aspect", "Express", "Hummingbird-2", STE-1, DFS-458, MFS-8, PGS-2 and others. The laser source is designed to excite atomic emission spectra when performing high-quality spectral analysis of hard rocks – metals, minerals, glasses and others.
Small-sized multichannel spectrometer - "Hummingbird-2"
The spectrometer was created according to the Cherni-Turner scheme based on a flat diffraction grating and an MAES analyzer with one line of photodetectors. It has increased photometric accuracy due to cooling and temperature stabilization of the photodetector range, as well as due to its shell-less design, in which there is no re-reflection of radiation on the cover glass and the background level in the recorded spectrum decreases. The optical scheme and design of the spectrometer are optimized to obtain a high-quality spectrum with a low level of background radiation in any of the regions lying in the spectral range of 190-1100 nm. The choice of the working area is carried out by changing and rotating the diffraction gratings. The sealed case of the spectrometer is filled with an inert gas. The radiation is injected into the spectrometer using a quartz capacitor or a fiber-optic cable with an SMA-905 connector. The optical scheme and design of the spectrometer are protected by patents.
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
MAX-GF1(2)E-C Spectrometer
The X-ray fluorescence spectrometer SPECTROSCAN MAX-GF1(2)E-C combines two methods of detecting an analytical signal: diffraction on a crystal (wave dispersion - WDX) and energy dispersion (EDX) method, as well as sample delivery adapted for the analysis of large-size images. The collimation of the primary radiation of the X-ray tube and the special design of the sample presentation make it possible to analyze the sample over an area of 1 cm2 in 1 mm increments, and thus investigate the distribution of elements over an area.
The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. With the help of fixed energy dispersion channels, any one or two additional elements in the range from magnesium (Mg) to calcium (Ca) can be determined.
With the help of this modification of the spectrometer, forensic and customs examinations, judicial and forensic medical examinations, as well as art-historical examinations are carried out.
NPO Spektron
Saint Petersburg
Produced in: Saint Petersburg
Spectrometer SPECTROSCAN MAX-GVM
The spectrometer is designed to determine the contents of elements in the range from Na to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters.
The principle of operation of the X-ray spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements to be determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element to be determined on the measured intensity.
Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the X-ray fluorescence spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.
NPO Spektron
Saint Petersburg
Produced in: Saint Petersburg
Diffrey-402M Desktop X-ray diffractometer by Scientific instruments
NAUCHNYE PRIBORY
Saint Petersburg
Produced in: Saint Petersburg
Grand ISP - Inductively coupled plasma mass spectrometer
The dual-view plasma spectrometer can record any spectral line simultaneously at high resolution in the concentration range from fractions of ppb up to tens of percent and offers a wide range of options for any research task.
Designed for the analysis of almost any type of environmental samples – water, soil, precipitation.
Quick switching to work. It does not require a long warm-up.
Low argon consumption.
Easy to use.
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
Steam generator of analytical samples of metal samples "Aspect"
During operation, the steam generator of metal samples "Aspect" provides control of all devices of the atomic emission spectral analysis complex - the MAES analyzer, the Ball Lightning generator, the inclusion of external devices;
A spark unipolar discharge is excited between a tungsten counterelectrode and the surface of the test samples - ingots of precious metals or other metal samples;
The intensity of erosion of the sample surface is regulated by changing the repetition frequency and power of spark pulses generated by a computer-controlled semiconductor spark generator;
The stability and quality of the frisking is monitored using a built-in spectrometer via optical fiber;
An adjustable flow of high-purity argon passes through the spark discharge zone in a sealed discharge chamber, picks up sample particles obtained by spark erosion of the surface and transfers them in the form of an aerosol to the area of the mixer/sprayer of the inductively coupled plasma torch of the optical emission spectrometer.;
The flow of high-purity argon is supplied, controlled and regulated by a microprocessor-controlled mass flow controller in the range from 0.5 to 3 l/min. Feed stability 0.01 l/min.
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
NANOEDUCATOR II
NanoEducator II, despite its compactness and ease of operation, supports all basic techniques of atomic force and scanning tunneling microscopy, so it can be used for any routine AFM and STM measurements and experiments in scientific research. Here are the results of some experiments in various scientific applications:
Study of atomic structures
Study of metallic nanostructures
Study of magnetic structures
Study of polymer objects
Study of biological objects
Study of carbon nanomaterials
NT-MDT Spectrum Instruments
Zelenograd
Produced in: Moscow, Zelenograd
Vacuum Spectrometer Favorite
Vacuum spectrometers are designed for rapid analysis of alloys based on iron, copper, aluminum and other metals in factory and research laboratories, including the determination of elements having analytical lines in the field of vacuum ultraviolet (VUV) (for example, S, P and C in steels).
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
Grand Expert Vacuum Spectrometer
Vacuum spectrometers are designed for rapid analysis of alloys based on iron, copper, aluminum and other metals in factory and research laboratories, including the determination of elements having analytical lines in the field of vacuum ultraviolet (VUV) (for example, S, P and C in steels).
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
Atomic Emission Complex "Grand Globula"
Atomic Emission Complex "Grand Globula" includes a spectrometer "Grand", a spectroanalytic generator "Ball Lightning" and a tripod "Globula". It allows the analysis of various substances and materials in arc and spark discharges in air, for example according to GOST 17818.15-90 "Graphite. Spectral analysis method", GOST 9717.1-82 "Copper. A method of spectral analysis based on metallic standard samples with photoelectric spectrum registration" and other MVIS.
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
Centaur I microscope by NanoScanTechnologies
Designed for comprehensive studies of the physical properties of the surface using classical optical microscopy, confocal laser microscopy, confocal spectroscopy and scanning probe microscopy (atomic force microscopy). It allows you to get full spectra of Raman (Raman or Raman) scattering and/or fluorescence, confocal laser and confocal spectral images (surface mapping), SPM (AFM) images. The design of the Centaur I complex allows the use of both separate methods (for example, confocal microscopy / spectroscopy) and the combination of methods (including the combination of scanning fields, AFM / Raman studies, etc.).
NANO SKAN TEKHNOLOGIYA
Dolgoprudny
Produced in: Dolgoprudny, Moscow region
Multipurpose X-ray diffractometer DRONE-8 (8H)
The multifunctional X-ray diffractometer DRON-8 (8H) with a vertical theta goniometer and the horizontal position of the sample allows X-ray diffraction analysis of the phase composition, structural state and orientation of a wide range of objects of various shapes and sizes.
Burevestnik
Kolomyagi
Produced in: Saint Petersburg
MAES Analyzer for Scintillation
MAES analyzers for recording atomic emission spectra with a time resolution of 1 ms are based on highly sensitive photodiodes and a special switching board for simultaneous reading of several sections of the spectra. The assembly of the rulers is installed on the "Grand" spectrometer.
A " Flow" or twin-jet arc plasmatron is used to excite the atomic emission spectra of powder samples.
The ATOM software registers the selected spectral lines and provides their processing according to the specified algorithms, taking into account the number and brightness of flashes (i.e. particle size).
Recording the spectra of powder samples with a large time resolution makes it possible to estimate the number and size of individual particles, identify their composition and determine the concentrations of elements in each particle, promptly assess the uniformity of the distribution of certain elements to be determined and expand the possibilities of spectral analysis without significant changes in sample preparation.
Main application areas:
mass analysis of powder geological samples by scintillation to determine gold, silver, platinum group metals, iridium, rhodium, etc. with detection limits up to 0.01 g/t;
qualitative determination of the composition of inclusions and mineral particles.
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
Spectrometer SPECTROSCAN MAX-G
The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters.
The principle of operation of the spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements being determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element being determined on the measured intensity.
Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.
NPO Spektron
Saint Petersburg
Produced in: Saint Petersburg
Atomic emission spectrometer Iskroline 500
1 supp.
The main advantage of a mobile spectrometer is the ability to measure the composition of alloys not only in the laboratory on specially prepared samples, but also directly in a workshop or warehouse without cutting the product or workpiece.
Iskrolajn
Saint Petersburg
Produced in: Saint Petersburg