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It is designed for recording absorption spectra of solid, liquid and gaseous substances in the near and middle IR region (including drugs, lacquers and paints, petroleum products, explosives, pharmacological preparations, polymer films and fibers) with their subsequent identification, as well as for qualitative and quantitative analysis of mixtures containing several components.

The spectrometer was created according to the Cherni-Turner scheme based on a flat diffraction grating and an MAES analyzer with one line of photodetectors. It has increased photometric accuracy due to cooling and temperature stabilization of the photodetector range, as well as due to its shell-less design, in which there is no re-reflection of radiation on the cover glass and the background level in the recorded spectrum decreases. The optical scheme and design of the spectrometer are optimized to obtain a high-quality spectrum with a low level of background radiation in any of the regions lying in the spectral range of 190-1100 nm. The choice of the working area is carried out by changing and rotating the diffraction gratings. The sealed case of the spectrometer is filled with an inert gas. The radiation is injected into the spectrometer using a quartz capacitor or a fiber-optic cable with an SMA-905 connector. The optical scheme and design of the spectrometer are protected by patents.

Specialized wavelength-dispersive XRF analyzer based on the Cochois scheme is designed for high-precision determination of chemical elements U, Th, Mo, Au, W, Tl, As, Pb as well as other elements in ores, rocks and when developing the technogenic fields. Possibility to determine groups of elements without readjustment of crystal-analyzer. Exceptionally high resolution of the Koshua X-ray optical scheme with crystal-analyzer quartz 1011. Developed mathematical support. Principle of analyzer operation is based on the excitation of the fluorescent radiation of sample atoms being under examination by radiation coming from an X-ray tube. Spectrum decomposition of the fluorescence radiation is performed according to Cauchois method. The fluorescence radiation focused by analyzing crystal and standard line are marked on Rowland focal circle. Then, they are recorded by X-ray radiation detector in turn. The intensity of the fluorescent irradiation with a particular wavelength is directly proportional to the chemical element concentration in the material under examination.

The X-ray fluorescence spectrometer SPECTROSCAN MAX-GF1(2)E-C combines two methods of detecting an analytical signal: diffraction on a crystal (wave dispersion - WDX) and energy dispersion (EDX) method, as well as sample delivery adapted for the analysis of large-size images. The collimation of the primary radiation of the X-ray tube and the special design of the sample presentation make it possible to analyze the sample over an area of 1 cm2 in 1 mm increments, and thus investigate the distribution of elements over an area. The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. With the help of fixed energy dispersion channels, any one or two additional elements in the range from magnesium (Mg) to calcium (Ca) can be determined. With the help of this modification of the spectrometer, forensic and customs examinations, judicial and forensic medical examinations, as well as art-historical examinations are carried out.

The spectrometer is designed to determine the contents of elements in the range from Na to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. The principle of operation of the X-ray spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements to be determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element to be determined on the measured intensity. Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the X-ray fluorescence spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.

The wide-range IR microscope of the MICRAN series, connected to the FT-801 and Infralum FT-801 Fourier spectrometers, is designed to study samples from 10 microns in size, including heterogeneous in composition. When working on an IR microscope, the operator has the opportunity to observe the object under study with a magnification of over 200X both using binoculars and on a monitor using a digital video camera, during photometry, select a local area of arbitrary shape with the help of diaphragms, and also “scan” the surface of the sample, observing the spectrum obtained in real time.

The flame spectrometer is designed for rapid determination of a wide range of concentrations (up to 8 orders of magnitude) of sodium, lithium, potassium, calcium, barium, caesium, rubidium in technological solutions. The excitation of atoms occurs in an air-acetylene flame. The device consists of a three-slit burner with flame control, a pneumatic sprayer, a spray chamber, an optical radiation input system into the "Hummingbird-2" spectrometer and an automatic air and acetylene supply system, with the possibility to control and adjust gas flow. The use of a three-slit burner provides increased flame temperature over the central slit of the burner due to the external flame layers. This makes it possible to determine low concentrations of calcium and barium. At the same time, it remains the possibility to determine impurities in highly concentrated solutions without clogging the burner slots. The lighting system of the spectrometer is mirror-lens, thanks to this, radiation collected from both sides of the burner is introduced into the polychromator.

Technical specifications: ESI / APCI ionization method Time-of-Flight Mass Analyzer The maximum repetition frequency of the ejection pulses is 10 kHz Recording speed of spectra Up to 100 spectra per second Characteristics of a 12-bit ADC, 2 GHz The number of simultaneously defined components is unlimited Mass range 1-2000 m/z Resolution > 4000 Vacuum system of 2 Fornaps and 3 TMN (240 l/sec) Overall dimensions 1450×780×1550 mm

Technical specifications: Method of ionization Plasma pulsed glow discharge Discharge gas Argon, consumption less than 1 l/hour Time-of-flight Mass Analyzer with mesh-free ion mirror Resolution 4000 The number of simultaneously defined components is unlimited Mass range 1-1000 m/z Detection limits 1-100 ppb Layer-by-layer resolution Up to 5 nm Depth of analysis Up to 30 microns The time for one analysis of a solid sample is 30 minutes (with the option of a revolver system – 3-5 minutes) Vacuum system 1 Booster pump and 2 TMN (240 l/sec) Overall dimensions 1450×780×1550 mm

The dual-view plasma spectrometer can record any spectral line simultaneously at high resolution in the concentration range from fractions of ppb up to tens of percent and offers a wide range of options for any research task. Designed for the analysis of almost any type of environmental samples – water, soil, precipitation. Quick switching to work. It does not require a long warm-up. Low argon consumption. Easy to use.

During operation, the steam generator of metal samples "Aspect" provides control of all devices of the atomic emission spectral analysis complex - the MAES analyzer, the Ball Lightning generator, the inclusion of external devices; A spark unipolar discharge is excited between a tungsten counterelectrode and the surface of the test samples - ingots of precious metals or other metal samples; The intensity of erosion of the sample surface is regulated by changing the repetition frequency and power of spark pulses generated by a computer-controlled semiconductor spark generator; The stability and quality of the frisking is monitored using a built-in spectrometer via optical fiber; An adjustable flow of high-purity argon passes through the spark discharge zone in a sealed discharge chamber, picks up sample particles obtained by spark erosion of the surface and transfers them in the form of an aerosol to the area of the mixer/sprayer of the inductively coupled plasma torch of the optical emission spectrometer.; The flow of high-purity argon is supplied, controlled and regulated by a microprocessor-controlled mass flow controller in the range from 0.5 to 3 l/min. Feed stability 0.01 l/min.

The generator is designed to produce an electric arc and spark discharge in atomic emission spectral analysis installations. The generator is designed specifically for use in spectral analysis of samples of complex composition for simultaneous determination of impurity and alloying components in a wide range of concentrations.