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NTEGRA NANO IR

NT-MDT Spectrum Instruments is an INTEGRA Nano IR–scattering scanning near‑field optical microscope (s-NSOM) designed for the infrared spectral range.

The AFM probe is located in the focus of an optical system that directs the IR laser radiation to the sample and collects the optical response. The collected radiation is sent to the Michelson interferometer for optical analysis.

The far-field component of the collected signal is suppressed by synchronous detection. The INTEGRA Nano IR system allows detecting the amplitude and phase of the near-field signal. The spatial resolution of the resulting reflection and absorption contrasts is approximately 10 nm and is determined only by the size of the tip of the probe.
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