Complex for atomic emission analysis of metals and alloys "Grand Expert"

NanoEducator II, despite its compactness and ease of operation, supports all basic techniques of atomic force and scanning tunneling microscopy, so it can be used for any routine AFM and STM measurements and experiments in scientific research. Here are the results of some experiments in various scientific applications: Study of atomic structures Study of metallic nanostructures Study of magnetic structures Study of polymer objects Study of biological objects Study of carbon nanomaterials

The main advantage of a mobile spectrometer is the ability to measure the composition of alloys not only in the laboratory on specially prepared samples, but also directly in a workshop or warehouse without cutting the product or workpiece.

During operation, the steam generator of metal samples "Aspect" provides control of all devices of the atomic emission spectral analysis complex - the MAES analyzer, the Ball Lightning generator, the inclusion of external devices; A spark unipolar discharge is excited between a tungsten counterelectrode and the surface of the test samples - ingots of precious metals or other metal samples; The intensity of erosion of the sample surface is regulated by changing the repetition frequency and power of spark pulses generated by a computer-controlled semiconductor spark generator; The stability and quality of the frisking is monitored using a built-in spectrometer via optical fiber; An adjustable flow of high-purity argon passes through the spark discharge zone in a sealed discharge chamber, picks up sample particles obtained by spark erosion of the surface and transfers them in the form of an aerosol to the area of the mixer/sprayer of the inductively coupled plasma torch of the optical emission spectrometer.; The flow of high-purity argon is supplied, controlled and regulated by a microprocessor-controlled mass flow controller in the range from 0.5 to 3 l/min. Feed stability 0.01 l/min.

The analyzer is designed to determine the mass fraction of sulfur in automotive fuel in accordance with GOST R 52660-2006 / GOST ISO 20884-2016, ASTM D6334, as well as in oil and petroleum products according to GOST R 53203-2008 / GOST 33194-2014, ASTM D2622, GB/T 11140-2008. Depending on the customer's needs, the analyzer is configured to work in accordance with a particular standard. Implements an arbitration method for measuring the mass fraction of sulfur in automobile fuel of the third, fourth and fifth classes. The device is designed specifically for high-quality and fast X-ray fluorescence analysis of fuel in accordance with the technical regulations "On requirements for automotive and aviation gasoline, diesel and marine fuel, jet fuel and heating oil", which establishes an arbitration X-ray fluorescence wave dispersion method for determining the mass fraction of sulfur in automotive fuels of the third, fourth and fifth classes. The wave dispersion sulfur analyzer SPECTROSCAN SW-D3 is designed taking into account all the requirements for the process of X-ray fluorescence elemental analysis of low sulfur contents in petroleum products. The operator's actions when performing measurements are minimized: - the number/name of the sample is entered from the built-in keyboard; - the sample is poured into two cuvettes; - the obtained samples are placed in the analyzer and measurements are started. The analyzer performs all subsequent actions automatically without operator involvement: - calculates and displays the sulfur content in the sample; - calculates convergence - the difference in determining the mass fraction of sulfur in the first and second samples; - prints measurement results on the built-in printer.

Designed for comprehensive studies of the physical properties of the surface using classical optical microscopy, confocal laser microscopy, confocal spectroscopy and scanning probe microscopy (atomic force microscopy). It allows you to get full spectra of Raman (Raman or Raman) scattering and/or fluorescence, confocal laser and confocal spectral images (surface mapping), SPM (AFM) images. The design of the Centaur I complex allows the use of both separate methods (for example, confocal microscopy / spectroscopy) and the combination of methods (including the combination of scanning fields, AFM / Raman studies, etc.).

The X-ray fluorescence spectrometer SPECTROSCAN MAX-GF1(2)E-C combines two methods of detecting an analytical signal: diffraction on a crystal (wave dispersion - WDX) and energy dispersion (EDX) method, as well as sample delivery adapted for the analysis of large-size images. The collimation of the primary radiation of the X-ray tube and the special design of the sample presentation make it possible to analyze the sample over an area of 1 cm2 in 1 mm increments, and thus investigate the distribution of elements over an area. The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. With the help of fixed energy dispersion channels, any one or two additional elements in the range from magnesium (Mg) to calcium (Ca) can be determined. With the help of this modification of the spectrometer, forensic and customs examinations, judicial and forensic medical examinations, as well as art-historical examinations are carried out.

The multifunctional X-ray diffractometer DRON-8 (8H) with a vertical theta goniometer and the horizontal position of the sample allows X-ray diffraction analysis of the phase composition, structural state and orientation of a wide range of objects of various shapes and sizes.

The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. The principle of operation of the spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements being determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element being determined on the measured intensity. Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.

MAES analyzers for recording atomic emission spectra with a time resolution of 1 ms are based on highly sensitive photodiodes and a special switching board for simultaneous reading of several sections of the spectra. The assembly of the rulers is installed on the "Grand" spectrometer. A " Flow" or twin-jet arc plasmatron is used to excite the atomic emission spectra of powder samples. The ATOM software registers the selected spectral lines and provides their processing according to the specified algorithms, taking into account the number and brightness of flashes (i.e. particle size). Recording the spectra of powder samples with a large time resolution makes it possible to estimate the number and size of individual particles, identify their composition and determine the concentrations of elements in each particle, promptly assess the uniformity of the distribution of certain elements to be determined and expand the possibilities of spectral analysis without significant changes in sample preparation. Main application areas: mass analysis of powder geological samples by scintillation to determine gold, silver, platinum group metals, iridium, rhodium, etc. with detection limits up to 0.01 g/t; qualitative determination of the composition of inclusions and mineral particles.

The dual-view plasma spectrometer can record any spectral line simultaneously at high resolution in the concentration range from fractions of ppb up to tens of percent and offers a wide range of options for any research task. Designed for the analysis of almost any type of environmental samples – water, soil, precipitation. Quick switching to work. It does not require a long warm-up. Low argon consumption. Easy to use.

Vacuum spectrometers are designed for rapid analysis of alloys based on iron, copper, aluminum and other metals in factory and research laboratories, including the determination of elements having analytical lines in the field of vacuum ultraviolet (VUV) (for example, S, P and C in steels).

The X-ray diffractometer DRON–8T is the flagship model of the line of stationary X-ray diffractometers of JSC IC Burevestnik. It is equipped with a high-precision wide-angle vertical goniometer with an angular reproducibility of 0.0001° and is designed mainly for the study of highly perfect crystalline objects (single crystals, epitaxial films) in high-resolution geometry.

Atomic Emission Complex "Grand Stream" is designed for rapid determination of the composition of powder samples of natural and industrial origin, includes a "Grand" spectrometer, a "Stream" installation and auxiliary equipment for sample preparation.