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Sulfur Analyzer SPECTROSCAN SW-D3
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Sulfur Analyzer SPECTROSCAN SW-D3
The analyzer is designed to determine the mass fraction of sulfur in automotive fuel in accordance with GOST R 52660-2006 / GOST ISO 20884-2016, ASTM D6334, as well as in oil and petroleum products according to GOST R 53203-2008 / GOST 33194-2014, ASTM D2622, GB/T 11140-2008. Depending on the customer's needs, the analyzer is configured to work in accordance with a particular standard.
Implements an arbitration method for measuring the mass fraction of sulfur in automobile fuel of the third, fourth and fifth classes.
The device is designed specifically for high-quality and fast X-ray fluorescence analysis of fuel in accordance with the technical regulations "On requirements for automotive and aviation gasoline, diesel and marine fuel, jet fuel and heating oil", which establishes an arbitration X-ray fluorescence wave dispersion method for determining the mass fraction of sulfur in automotive fuels of the third, fourth and fifth classes.
The wave dispersion sulfur analyzer SPECTROSCAN SW-D3 is designed taking into account all the requirements for the process of X-ray fluorescence elemental analysis of low sulfur contents in petroleum products. The operator's actions when performing measurements are minimized:
- the number/name of the sample is entered from the built-in keyboard;
- the sample is poured into two cuvettes;
- the obtained samples are placed in the analyzer and measurements are started.
The analyzer performs all subsequent actions automatically without operator involvement:
- calculates and displays the sulfur content in the sample;
- calculates convergence - the difference in determining the mass fraction of sulfur in the first and second samples;
- prints measurement results on the built-in printer.
Implements an arbitration method for measuring the mass fraction of sulfur in automobile fuel of the third, fourth and fifth classes.
The device is designed specifically for high-quality and fast X-ray fluorescence analysis of fuel in accordance with the technical regulations "On requirements for automotive and aviation gasoline, diesel and marine fuel, jet fuel and heating oil", which establishes an arbitration X-ray fluorescence wave dispersion method for determining the mass fraction of sulfur in automotive fuels of the third, fourth and fifth classes.
The wave dispersion sulfur analyzer SPECTROSCAN SW-D3 is designed taking into account all the requirements for the process of X-ray fluorescence elemental analysis of low sulfur contents in petroleum products. The operator's actions when performing measurements are minimized:
- the number/name of the sample is entered from the built-in keyboard;
- the sample is poured into two cuvettes;
- the obtained samples are placed in the analyzer and measurements are started.
The analyzer performs all subsequent actions automatically without operator involvement:
- calculates and displays the sulfur content in the sample;
- calculates convergence - the difference in determining the mass fraction of sulfur in the first and second samples;
- prints measurement results on the built-in printer.
Specialized X-ray wavelength dispersive analyzer ARF-7
Specialized wavelength-dispersive XRF analyzer based on the Cochois scheme is designed for high-precision determination of chemical elements U, Th, Mo, Au, W, Tl, As, Pb as well as other elements in ores, rocks and when developing the technogenic fields.
Possibility to determine groups of elements without readjustment of crystal-analyzer.
Exceptionally high resolution of the Koshua X-ray optical scheme with crystal-analyzer quartz 1011.
Developed mathematical support.
Principle of analyzer operation is based on the excitation of the fluorescent radiation of sample atoms being under examination by radiation coming from an X-ray tube. Spectrum decomposition of the fluorescence radiation is performed according to Cauchois method. The fluorescence radiation focused by analyzing crystal and standard line are marked on Rowland focal circle. Then, they are recorded by X-ray radiation detector in turn. The intensity of the fluorescent irradiation with a particular wavelength is directly proportional to the chemical element concentration in the material under examination.
Burevestnik
Kolomyagi
Produced in: Saint Petersburg
MAX-GF1(2)E-C Spectrometer
The X-ray fluorescence spectrometer SPECTROSCAN MAX-GF1(2)E-C combines two methods of detecting an analytical signal: diffraction on a crystal (wave dispersion - WDX) and energy dispersion (EDX) method, as well as sample delivery adapted for the analysis of large-size images. The collimation of the primary radiation of the X-ray tube and the special design of the sample presentation make it possible to analyze the sample over an area of 1 cm2 in 1 mm increments, and thus investigate the distribution of elements over an area.
The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. With the help of fixed energy dispersion channels, any one or two additional elements in the range from magnesium (Mg) to calcium (Ca) can be determined.
With the help of this modification of the spectrometer, forensic and customs examinations, judicial and forensic medical examinations, as well as art-historical examinations are carried out.
NPO Spektron
Saint Petersburg
Produced in: Saint Petersburg
Spectrometer SPECTROSCAN MAX-GVM
The spectrometer is designed to determine the contents of elements in the range from Na to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters.
The principle of operation of the X-ray spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements to be determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element to be determined on the measured intensity.
Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the X-ray fluorescence spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.
NPO Spektron
Saint Petersburg
Produced in: Saint Petersburg
Wavelegth dispersive sulfur-in-oil analyzer ASV-2
The sulfur analyzer ASV-2 is designed to measure the mass fraction of sulfur in gasoline (unleaded), diesel fuel, oil, kerosene, oil residues, lubricating oil bases, hydraulic oils, jet fuels, crude oil and other distillate oil products.
The ASV-2 analyzer allows to perform the functions of determining sulfur both in the vacuum mode of the measuring chamber and in the helium purge mode. For this purpose the device is equipped with a set of accessories for connection of the analyzer to the helium post.
Burevestnik
Kolomyagi
Produced in: Saint Petersburg
Energy dispersive sulfur-in-oil analyzer ASE-2
The ASE-2 energy dispersive sulfur analyzer is designed to measure the mass fraction of sulfur in unleaded gasoline, diesel fuel, crude oil, kerosene, oil residues, lubricating oil bases, hydraulic oils, jet fuels and other distillate oil products.
X-ray radiation from a low-power X-ray tube, converted by a primary radiation filter, excites fluorescence emission from the atoms of the sample being analyzed. The fluxes (primary X-rays scattered on the sample and secondary fluorescence) of radiation fall on a gas proportional counter, whereby the fluorescence radiation of sulfur atoms (SKa) is separated from the radiation with other energies by means of selective filters. The intensity of the fluorescence emission of sulfur atoms registered by the gas proportional counter is proportional to the mass fraction of sulfur in the analyzed sample.
Burevestnik
Kolomyagi
Produced in: Saint Petersburg
X-ray fluorescence wavelength dispersive flowstream pulp, suspension and solution analyzer AR-35
The AP-35 analyzer is a fully automated analytical complex designed for continuous X-ray fluorescence analysis of the chemical composition of slurries and solutions in flow. The instrument has a movable software-controlled measuring head with an X-ray tube and fixed spectrometric channels (up to 8), each of which can be set up for any chemical element (from Ca to U). In operation, up to 15 flow cells are measured by the head according to a preset program.
Multi channel capability (up to 15 products to be measured).
Compatibility with automation systems for sampling, sample delivery, data handling and presentation, data archiving.
Link to factory process control system
High expressiveness, high analytical precision, low detection limits, reproducibility
High reliability.
The principle of operation is based on the excited fluorescence produced by the atoms of the material under analysis through the radiation of an X-ray tube. The fluorescence radiation of a particular chemical element is picked up by the crystal analyzer, and then the radiation at a specific wavelength is detected by an X-ray tube detector. The intensity of the recorded fluorescence radiation of a certain wavelength is directly proportional to the mass fraction of the chemical element in the substance under study.
Burevestnik
Kolomyagi
Produced in: Saint Petersburg
Spectrometer SPECTROSCAN MAX-G
The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters.
The principle of operation of the spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements being determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element being determined on the measured intensity.
Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.
NPO Spektron
Saint Petersburg
Produced in: Saint Petersburg
Small-sized multichannel spectrometer - "Hummingbird-2"
The spectrometer was created according to the Cherni-Turner scheme based on a flat diffraction grating and an MAES analyzer with one line of photodetectors. It has increased photometric accuracy due to cooling and temperature stabilization of the photodetector range, as well as due to its shell-less design, in which there is no re-reflection of radiation on the cover glass and the background level in the recorded spectrum decreases. The optical scheme and design of the spectrometer are optimized to obtain a high-quality spectrum with a low level of background radiation in any of the regions lying in the spectral range of 190-1100 nm. The choice of the working area is carried out by changing and rotating the diffraction gratings. The sealed case of the spectrometer is filled with an inert gas. The radiation is injected into the spectrometer using a quartz capacitor or a fiber-optic cable with an SMA-905 connector. The optical scheme and design of the spectrometer are protected by patents.
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
MAX-GF1(2)E-C Spectrometer
The X-ray fluorescence spectrometer SPECTROSCAN MAX-GF1(2)E-C combines two methods of detecting an analytical signal: diffraction on a crystal (wave dispersion - WDX) and energy dispersion (EDX) method, as well as sample delivery adapted for the analysis of large-size images. The collimation of the primary radiation of the X-ray tube and the special design of the sample presentation make it possible to analyze the sample over an area of 1 cm2 in 1 mm increments, and thus investigate the distribution of elements over an area.
The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. With the help of fixed energy dispersion channels, any one or two additional elements in the range from magnesium (Mg) to calcium (Ca) can be determined.
With the help of this modification of the spectrometer, forensic and customs examinations, judicial and forensic medical examinations, as well as art-historical examinations are carried out.
NPO Spektron
Saint Petersburg
Produced in: Saint Petersburg
Spectrometer SPECTROSCAN MAX-GVM
The spectrometer is designed to determine the contents of elements in the range from Na to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters.
The principle of operation of the X-ray spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements to be determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element to be determined on the measured intensity.
Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the X-ray fluorescence spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.
NPO Spektron
Saint Petersburg
Produced in: Saint Petersburg
Diffrey-402M Desktop X-ray diffractometer by Scientific instruments
NAUCHNYE PRIBORY
Saint Petersburg
Produced in: Saint Petersburg
Grand ISP - Inductively coupled plasma mass spectrometer
The dual-view plasma spectrometer can record any spectral line simultaneously at high resolution in the concentration range from fractions of ppb up to tens of percent and offers a wide range of options for any research task.
Designed for the analysis of almost any type of environmental samples – water, soil, precipitation.
Quick switching to work. It does not require a long warm-up.
Low argon consumption.
Easy to use.
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
Steam generator of analytical samples of metal samples "Aspect"
During operation, the steam generator of metal samples "Aspect" provides control of all devices of the atomic emission spectral analysis complex - the MAES analyzer, the Ball Lightning generator, the inclusion of external devices;
A spark unipolar discharge is excited between a tungsten counterelectrode and the surface of the test samples - ingots of precious metals or other metal samples;
The intensity of erosion of the sample surface is regulated by changing the repetition frequency and power of spark pulses generated by a computer-controlled semiconductor spark generator;
The stability and quality of the frisking is monitored using a built-in spectrometer via optical fiber;
An adjustable flow of high-purity argon passes through the spark discharge zone in a sealed discharge chamber, picks up sample particles obtained by spark erosion of the surface and transfers them in the form of an aerosol to the area of the mixer/sprayer of the inductively coupled plasma torch of the optical emission spectrometer.;
The flow of high-purity argon is supplied, controlled and regulated by a microprocessor-controlled mass flow controller in the range from 0.5 to 3 l/min. Feed stability 0.01 l/min.
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
NANOEDUCATOR II
NanoEducator II, despite its compactness and ease of operation, supports all basic techniques of atomic force and scanning tunneling microscopy, so it can be used for any routine AFM and STM measurements and experiments in scientific research. Here are the results of some experiments in various scientific applications:
Study of atomic structures
Study of metallic nanostructures
Study of magnetic structures
Study of polymer objects
Study of biological objects
Study of carbon nanomaterials
NT-MDT Spectrum Instruments
Zelenograd
Produced in: Moscow, Zelenograd
Vacuum Spectrometer Favorite
Vacuum spectrometers are designed for rapid analysis of alloys based on iron, copper, aluminum and other metals in factory and research laboratories, including the determination of elements having analytical lines in the field of vacuum ultraviolet (VUV) (for example, S, P and C in steels).
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
Grand Expert Vacuum Spectrometer
Vacuum spectrometers are designed for rapid analysis of alloys based on iron, copper, aluminum and other metals in factory and research laboratories, including the determination of elements having analytical lines in the field of vacuum ultraviolet (VUV) (for example, S, P and C in steels).
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
Atomic Emission Complex "Grand Globula"
Atomic Emission Complex "Grand Globula" includes a spectrometer "Grand", a spectroanalytic generator "Ball Lightning" and a tripod "Globula". It allows the analysis of various substances and materials in arc and spark discharges in air, for example according to GOST 17818.15-90 "Graphite. Spectral analysis method", GOST 9717.1-82 "Copper. A method of spectral analysis based on metallic standard samples with photoelectric spectrum registration" and other MVIS.
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
Centaur I microscope by NanoScanTechnologies
Designed for comprehensive studies of the physical properties of the surface using classical optical microscopy, confocal laser microscopy, confocal spectroscopy and scanning probe microscopy (atomic force microscopy). It allows you to get full spectra of Raman (Raman or Raman) scattering and/or fluorescence, confocal laser and confocal spectral images (surface mapping), SPM (AFM) images. The design of the Centaur I complex allows the use of both separate methods (for example, confocal microscopy / spectroscopy) and the combination of methods (including the combination of scanning fields, AFM / Raman studies, etc.).
NANO SKAN TEKHNOLOGIYA
Dolgoprudny
Produced in: Dolgoprudny, Moscow region
Multipurpose X-ray diffractometer DRONE-8 (8H)
The multifunctional X-ray diffractometer DRON-8 (8H) with a vertical theta goniometer and the horizontal position of the sample allows X-ray diffraction analysis of the phase composition, structural state and orientation of a wide range of objects of various shapes and sizes.
Burevestnik
Kolomyagi
Produced in: Saint Petersburg
MAES Analyzer for Scintillation
MAES analyzers for recording atomic emission spectra with a time resolution of 1 ms are based on highly sensitive photodiodes and a special switching board for simultaneous reading of several sections of the spectra. The assembly of the rulers is installed on the "Grand" spectrometer.
A " Flow" or twin-jet arc plasmatron is used to excite the atomic emission spectra of powder samples.
The ATOM software registers the selected spectral lines and provides their processing according to the specified algorithms, taking into account the number and brightness of flashes (i.e. particle size).
Recording the spectra of powder samples with a large time resolution makes it possible to estimate the number and size of individual particles, identify their composition and determine the concentrations of elements in each particle, promptly assess the uniformity of the distribution of certain elements to be determined and expand the possibilities of spectral analysis without significant changes in sample preparation.
Main application areas:
mass analysis of powder geological samples by scintillation to determine gold, silver, platinum group metals, iridium, rhodium, etc. with detection limits up to 0.01 g/t;
qualitative determination of the composition of inclusions and mineral particles.
VMK OPTOELEKTRONIKA
Novosibirsk
Produced in: Novosibirsk
Spectrometer SPECTROSCAN MAX-G
The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters.
The principle of operation of the spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements being determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element being determined on the measured intensity.
Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.
NPO Spektron
Saint Petersburg
Produced in: Saint Petersburg
Atomic emission spectrometer Iskroline 500
1 supp.
The main advantage of a mobile spectrometer is the ability to measure the composition of alloys not only in the laboratory on specially prepared samples, but also directly in a workshop or warehouse without cutting the product or workpiece.
Iskrolajn
Saint Petersburg
Produced in: Saint Petersburg