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Reflection prefix PO-45 V

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Reflection prefix PO-45 V
Manufacturer:
SIMEKS
Location:
Novosibirsk
Applying:
Other:
It is intended for express analysis of various types of solid opaque samples, including polymer films and fragments, paint coatings, finished dosage forms in the form of tablets, optical parts and semiconductor materials.



• The sample is located on the subject plane of the investigated surface downwards, the angle of incidence of the central beam on the sample is 45 °
• The diameter of the focus spot is 3 mm
• Allows you to explore objects of any shape and size
• When using a mini-press, it allows you to examine samples in the form of a thin layer rolled out on a mirror plate made of alloy steel (radiation passes through the substance layer twice, reflecting from the mirror surface)
• Not used: for the study of bulk and liquid substances
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