Search

Mathematical processing of the measurement makes it possible to determine and display on the indicator board the relative systematic change in frequency, the average relative value of the frequency difference, the RMS relative frequency deviation, the RMS relative two-sample frequency deviation.

Measurement of roughness parameters Ra; Rz; Rmax; Rp; Rv; Rq; Sm; S; la; lq; tp; Lo; D; da; dq, etc., viewing the profilogram and measuring the size of inhomogeneities Tracing length: 0.5mm – 40 mm Measurement range according to Ra: 0.012 – 50mkm Degree of accuracy 1 (error 2%) Work inside the vestibule > 3mm

Viewing and measuring grains and defects in the structure of materials, resolution to atoms (Nobel Prize in 1986), replacement of metal-graphic and electron microscopes Increase: from x2 thousand to x10 million. Measuring range: 0.2 nm to 30 microns All basic (STM, contact and vibro-AFM) modes, and more than 25 extras.modes

Nitrogen traps are designed for use in various vacuum systems in order to prevent the ingress of vapor gases and various organic compounds from high-vacuum and pre-vacuum pumps into the vacuum chamber (system) following in the reverse flow, as well as to protect vacuum units from organic substances present in the vacuum volume.

For scientific and industrial applications.

The helium leak detector TI1-50M is a universal highly sensitive device designed to test the tightness of various systems and objects that allow pumping out the internal cavity, as well as those filled with helium or a mixture containing helium, and detect (localize) places of leakage (leaks). Specifications: Measuring range at the leak detector inlet, Pa•m3/s from 5•10-13 to 1•10-5; Range of indications when working by probe method, Pa•m3/s from 1•10-9 to 1•10-5; Time to enter the readiness mode for measurements, no more than, min 5; AC supply voltage, V, Hz 220±10%, 50±1; Power consumption, VA 1200; Overall dimensions (WxHxD), no more than, mm 480x470x390; Weight, no more than, kg 40; Average time to metrological failure, h 15000;

It is designed to search for leaks of freons and other halogen-containing gases, for example, gas, in working equipment, and when testing systems, including cable ones, for tightness. The GTI-8 halogen leak detector also allows detecting an increase in the concentration of such gases in the room or near the controlled object. Technical characteristics of the leak detector "GTI-8" Parameter Sensitivity of the leak detector GTI-8, m3 Pa/sec., not less 1.0 - 5.3/10e-7 Time constant, sec., no more 3 Compensation of the initial sensor current Availability Automatic background signal compensation Availability Adjustable trigger threshold Availability Food ~220V, 50Hz (14.8V for GTI-8B) For modification of GTI-8B, continuous operation time, hour, at least 8 Operating mode setting time, min, no more 5

Horizontal vacuum resistance furnaces are designed for carrying out various technological processes in high vacuum at temperatures up to 1600 degrees. The furnace can be used in electronic, radio engineering, aviation, rocket and other industries. The main areas of application are the technological processes of annealing, quenching, degassing and sintering.

Vacuum chambers can be used: for drying materials (low vacuum), testing spacecraft, during experiments on plasma retention and antimatter production, as elements of charged particle accelerator systems and systems for applying thin films. Vacuum chambers can be used: for drying materials (low vacuum), testing spacecraft, during experiments on plasma retention and antimatter production, as elements of charged particle accelerator systems and systems for applying thin films.

A higher–level device with extreme sensitivity and an additional set of functions that allow you to expand the possibilities for conducting spectral studies: · revolver mechanism with 4 interchangeable lenses - mirror IR 15X, NPVO, lens 4X, lens 10X; · registration of spectra in the modes of specular and diffuse reflection, transmission and NIP; · increased sensitivity, which allows recording the spectra of micro-objects with sizes from 5 microns; · built-in control panel with advanced functions; · automated mapping system; · the rectangular slit diaphragm is made of special glass – after the fragment is selected, the rest of the field of view is also available to the user, which greatly simplifies photometry of extended surfaces with local inhomogeneities; · specialized software for controlling the microscope and processing the results. Liquid nitrogen is required to work with an IR microscope.

Designed for monitoring processes in reactors, vacuum chambers, gas pipelines, etc.

The wide-range IR microscope of the MICRAN series, connected to the FT-801 and Infralum FT-801 Fourier spectrometers, is designed to study samples from 10 microns in size, including heterogeneous in composition. When working on an IR microscope, the operator has the opportunity to observe the object under study with a magnification of over 200X both using binoculars and on a monitor using a digital video camera, during photometry, select a local area of arbitrary shape with the help of diaphragms, and also “scan” the surface of the sample, observing the spectrum obtained in real time.