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Technical specifications: Method of ionization Plasma pulsed glow discharge Discharge gas Argon, consumption less than 1 l/hour Time-of-flight Mass Analyzer with mesh-free ion mirror Resolution 4000 The number of simultaneously defined components is unlimited Mass range 1-1000 m/z Detection limits 1-100 ppb Layer-by-layer resolution Up to 5 nm Depth of analysis Up to 30 microns The time for one analysis of a solid sample is 30 minutes (with the option of a revolver system – 3-5 minutes) Vacuum system 1 Booster pump and 2 TMN (240 l/sec) Overall dimensions 1450×780×1550 mm

The multifunctional X-ray diffractometer DRON-8 (8H) with a vertical theta goniometer and the horizontal position of the sample allows X-ray diffraction analysis of the phase composition, structural state and orientation of a wide range of objects of various shapes and sizes.

The device is designed to analyze the phase composition and structural state of polycrystalline objects of various origins.

The X-ray diffractometer DRON–8T is the flagship model of the line of stationary X-ray diffractometers of JSC IC Burevestnik. It is equipped with a high-precision wide-angle vertical goniometer with an angular reproducibility of 0.0001° and is designed mainly for the study of highly perfect crystalline objects (single crystals, epitaxial films) in high-resolution geometry.