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The small-sized digital magnetometer (Gaussmeter, teslameter), ION-3701 residual magnetization meter is a modern high-precision instrument, a further development of ION series devices (ION-1, ION-2, ION-2M, ION-7) and used for a wide range of tasks in areas where it is necessary to determine the magnitude of the magnetic field and residual magnetization. It is equipped with a three-dimensional magnetic field sensor and has outstanding technical characteristics and extensive functionality.

The ultimate display quality is ensured by the use of built-in acoustic and vibration isolation, thermal stabilization, the industry's best sensitivity of the optical recording system and the unique design of the scanning probe system, which allows achieving atomic resolution in routine measurements. In the basic configuration, 50+ AFM techniques are available, including the HybriD method, which allows conducting all cutting-edge nanomechanical, electrical and magnetic studies. Intelligent ScanTronic™ algorithm for one-click optimization of scanning parameters, which allows for perfect relief measurements using the amplitude-modulation method, regardless of the operator's experience. Automated examination of multiple samples using a simple user interface to create a point-by-point scanning scenario and a database for stored received images. Control of samples with dimensions up to 200×200 mm and thickness up to 40 mm at any point of the surface with a positioning accuracy of 1 micron. Wide customization possibilities: installation of additional optical equipment, development of specialized sample holders, combination with a transport system, automation of measurements and data analysis in accordance with customer requirements.

NT-MDT Spectrum Instruments is an INTEGRA Nano IR–scattering scanning near‑field optical microscope (s-NSOM) designed for the infrared spectral range. The AFM probe is located in the focus of an optical system that directs the IR laser radiation to the sample and collects the optical response. The collected radiation is sent to the Michelson interferometer for optical analysis. The far-field component of the collected signal is suppressed by synchronous detection. The INTEGRA Nano IR system allows detecting the amplitude and phase of the near-field signal. The spatial resolution of the resulting reflection and absorption contrasts is approximately 10 nm and is determined only by the size of the tip of the probe.

NTEGRA Spectra II is already a second-generation measuring system that successfully demonstrates the unification of two worlds: AFM and Raman spectroscopy. It can perform multiple functions ranging from relief mapping to 2D spectral analysis, from studies of electrical and mechanical properties to optical measurements with a resolution below the diffraction limit. Now scientists can conduct a complete physico-chemical analysis of the surface properties of the sample at a time. As a result, researchers get unlimited opportunities to develop their laboratory techniques.

The device is capable of operating both independently and as part of automated measuring systems with USB and IEEE-488 interfaces (CPC). Technical specifications Frequency range from 100 kHz to 37.5 GHz VSWR input of the device with a matching fixed attenuator attenuation of 10 dB, depending on the frequency range, no more • from 100 kHz to 180 MHz 1.15 • from 0.18 to 2 GHz 1.25 • from 2 to 12 GHz 1.30 • from 12 to 17.85 GHz 1.50 • from 17.85 to 37.5 GHz 2.00 Operating temperature range from 5 to 40 °C AC power supply 220 V, 50 Hz Power consumption, no more than 125 VA Overall dimensions, mm 216x493x508.5 Weight, not more than 32 kg

A small-sized digital magnetometer (gaussmeter, teslameter), a residual magnetization meter ION-3701 version "North" is a modern high-precision device (a variant of the ION-3701 device) and used for a wide range of tasks in areas where it is necessary to determine the magnitude of the magnetic field and residual magnetization in adverse climates, conditions of negative temperatures, the Far North and etc . It is equipped with a three-dimensional magnetic field sensor and has outstanding technical characteristics and extensive functionality.

The use of a terminal block makes it easier to connect sensors to the input of the measuring device. It is used with THERMOTEST 100, THERMOTEST 300, THERMOTEST 05 and THERMOTEST-05-1 thermostats.

14 high-precision stepper motors control all moving parts of the microscope, and intelligent software blurs the line between optical and SPM imaging. NEXT provides continuous magnification from millimeter-scale panoramic optical images to atomic resolution, and intermediate operations such as laser pointing to the cantilever, sample positioning, soft approach and configuration of advanced SPM techniques occur automatically.

The complex is equipped with air conditioning, heating and ventilation systems to create and maintain a preset temperature level (20 ...25) ° C in the van body, at an outdoor temperature from minus 40 ° C to 40 ° C. PLIT-A2-4/1M is equipped with a removable diesel electric unit with a capacity of 16 kW, which ensures the functioning of all systems in autonomous mode. A set of functionally related working standards, special equipment and automation tools allows you to implement comprehensive metrological maintenance of measuring instruments at workplaces

NT-MDT S.I. presents NTEGRA II, the second generation of the world's most popular AFM. Thanks to additional features and advanced functions, it provides an unprecedented level of modularity and flexibility, becoming a true partner of the researcher. Intelligent, fast, reliable, accurate and undoubtedly easy to use. To eliminate the influence of a noisy environment, the NTEGRA II is supplied in a standard cabinet that provides temperature control, acoustic and vibration isolation. This combination reveals the true nature of NTEGRA II as the most stable AFM in the world, providing a temperature drift of less than 0.2 nm/min.

KOIDZ-VD kits consist of samples of artificial defects (SAD) and samples of gaps (SG). Samples of artificial defects are made in the form of flat and curved plates and cylinders, on the working surfaces of which defects are made in the form of continuity violations like slits of various depths, opening widths and lengths. The working surfaces of flat SADs are two opposite surfaces on which longitudinal slits are cut by an electroerosion method The working surfaces of the SAD, reproducing a positive curved surface, are samples with a cylindrical surface. The working surface of the SAD reproducing negative curvature is the inner surface of the curved plate — the place of inflection. The KOIDZ-VD kit contains an SAD for determining the influence of various quantities. To determine the effect of the roughness of the working surfaces, the kit contains SADs with different roughness, on which defects of the same depth are made. To determine the effect of positive curvature and surface roughness, the kit contains cylindrical samples with different roughness of working surfaces on which defects of the same depth are made. To determine the simultaneous effect of negative curvature and surface roughness, the kit contains curved plates on which two defects of the same depth are cut, one of which is located on the flat, the other on the curved parts of the sample. To determine the effect of the chemical composition of the material of the controlled products, the kit contains samples of steel 10, steel 20 and steel 45. The same defects are made on each sample. To account for the influence of specific electrical conductivity, the kit contains samples from non-magnetic structural materials: aluminum alloy D16T and titanium alloy VT-23. The same defects are made on each sample. Gap samples are flat and curved plates of different thicknesses made of dielectric material. Technical specifications The range of nominal values of the depth of defects, mm: from 0.1 to 10. The limits of permissible error of the value of the depth of defects, mm: from ± 0.02 to ± 0.25. The range of nominal values of the width of the opening of defects, mm: from 0.03 to 0.15. The limits of the permissible error of the width of the opening of defects, mm: from ± 0.01 to ± 0.05. The range of nominal values of the length of defects, mm: from 6 to 100. The limits of permissible error of the value of the length of defects, mm: from ± 0.5 to ± 1. The range of nominal values of the thickness of the dielectric gap samples, mm: from 0.2 to 10. The limits of the permissible error of the thickness of the samples, mm: from ± 0.02 to ± 0.5. The range of nominal values of the radius of curvature of curved surfaces with defects, mm: - convex: from 13 to 510; - concave: 10.